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A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stem] or [esti:i:em]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 - 0.2 nm) which is then scanned over the sample

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