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(GTOs). This excellent feature of the IGBT had suddenly emerged when the non-latch-up IGBT was established in 1984 by solving the problem of so-called "latch-up", which is the main cause of device destruction or device failure. Before that, the developed devices were very weak and were easily destroyed by "latch-up".

Practical devices

Practical devices capable of operating over an extended current range were first reported by B. Jayant Baliga et al. in 1982. The first experimental demonstration

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