the feedback, and can sometimes reveal features that the feedback was not able to adjust for.

The AFM signals, such as sample height or cantilever deflection, are recorded on a computer during the x-y scan. They are plotted in a pseudocolor image, in which each pixel represents an x-y position on the sample, and the color represents the recorded signal.

History

The AFM was invented by IBM scientists in 1985. The precursor to the AFM, the scanning tunneling microscope

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