distance between the tip and the sample.

The scanning tunneling microscope is used to obtain "topographs" - topographic maps - of surfaces. The tip is rastered across a surface and, in constant current mode, a constant current is maintained between the tip and the sample by adjusting the height of the tip. A plot of the tip height at all measurement positions provides the topograph. These topographic images can obtain atomically resolved information on metallic and semiconducting surfaces.

However, the scanning tunneling microscope

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