allows scientist to retrieve topographical, elemental, chemical, and magnetic contrast of surfaces.

LEEM instruments are often equipped with light sources to perform PEEM imaging. This helps in system alignment and enables collection LEEM, PEEM and ARPES data of a single sample in a single instrument.

Mirror electron microscopy (MEM)

In mirror electron microscopy, electrons are slowed in the retarding field of the condenser lens to the limit of the instrument and thus, only allowed to interact

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