to several nanometers, allowing the study of buried interfaces. This method is referred to as high-energy X-ray photoemission spectroscopy (HAXPES). Furthermore, the tunable nature of the synchrotron X-ray photon energies presents a wide range of depth sensitivity in the order of 2-50 nm. This allows for probing of samples at greater depths and for non destructive depth-profiling experiments.

Material composition can be quantitatively analyzed using X-ray fluorescence (XRF). XRF detection is