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<p>model assumes that only one input on one gate will be faulty at a time, assuming that if more are faulty, a test that can detect any single fault, should easily find multiple faults.</p>

<p>To use this fault model, each input pin on each gate in turn, is assumed to be grounded, and a test vector is developed to indicate the circuit is faulty. The test vector is a collection of bits to apply to the circuit's inputs, and a collection of bits expected at the circuit's output. If the gate pin under consideration is grounded, and this test vector</p><p>
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