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*Floorplanning: The RTL of the chip is assigned to gross regions of the chip, input/output (I/O) pins are assigned and large objects (arrays, cores, etc.) are placed.
*Logic synthesis: The RTL is mapped into a gate-level netlist in the target technology of the chip.
*Design for Testability: The test structures like scan chains are inserted.
*Placement: The gates in the netlist are assigned to nonoverlapping

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